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AWR Version 14
This example was removed in V14.
AWR Version 13
Note: This example is only available in Version 13.0.
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Using a Marker to Select Sweep Variables in Other Measurements
This project shows some examples of using a marker on one measurement to specify the swept variable values on another.
To see this in action, select Simulate > Analyze. When the simulation is finished, maximize any of the schematic windows, double-click on the graph with the marker in it to edit, and move the marker by dragging the small triangle on the trace, not the rectangular label.
Measurements on documents* that involve swept variables allow several ways of selecting how the variables should be used or selected; e.g. Use for x-axis, Plot all traces, Select with tuner, etc. This list of options will include any markers on other measurements with the same source document, if those markers allow the selection of the variable. In the list, a marker will be identified by its marker ID and the name of the graph in which it appears. To display marker IDs, which is useful when there are multiple markers present, right-click in the graph window > Properties > Markers tab, and check Data markers in legend.
A marker on a measurement can affect any other measurements on the same source document. Moving such a marker will automatically and immediately update the measurements that depend on it.
The examples in this project are distinct from one another, and are identified by the numerical prefix in the associated document names.
Relevant notes on working in the AWR design environment (AWRDE):
1. Window-in-window (e.g. the graph and equation windows embedded in the schematics): click once to move or reshape the embedded window, double-click to interact with and edit the contents of the window.
2. Output Equations: to edit an output equation, shown in a teal/green color by default, right click on it and select Properties Double-clicking leads to manual editing, which can be used to change the name (left side of the equals sign), but editing the measurement this way is error-prone.
This first example is not a practical application, but a simple demonstration. The marker is placed on the s11 measurement in the Smith chart "1 Simple s11". Moving this marker among the traces updates three other measurements, so that they correspond to the same combination of swept parameter values: a second measurement on the same graph that highlights the marked trace, and the s21 and s11 measurements in dB on the rectangular graph "1 Simple s21 and s11 dB". Edit any of these dependent measurements (e.g. double-click on them in the project browser) to see how the swept parameters are specified by the marker.
The schematic "2_IV_to_Sparameters" is set up to sweep the drain and gate bias voltages of a common-source FET. A DC drain current measurement plots the I-V curve in the "2 IV" graph. Moving the marker on the I-V curves updates s22, measured at the nearest simulated bias point, in the Smith chart "2 s22 Based on IV Marker".
The schematic "3_Spectrum_and_Time_Domain" is set up to perform a power sweep, driving the biased transistor well into compression at each of 3 frequencies. The power curves are plotted in the graph "3 Pout vs Pin". Moving the marker in this graph will automatically update the output spectrum and time domain voltage waveform plotted in the aptly named "3 Spectrum" and "3 Time Domain" graphs.
* A measurement's data source document can be a schematic, MDIF data file, EM structure, etc.
Schematic - 3_Spectrum_and_Time_Domain
Schematic - 2_IV_to_Sparameters
Schematic - 1_Simple