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This example implements a typical Device-Under-Test (DUT), which includes amplitude and phase imbalance, DC offset, phase noise, and a file-based power amplifier. The test bench monitors the following measurements:

The CCDF at the input and output of the DUT

The signal spectrum at the input and output of the DUT

EVM %rms vs. output power

AM-to-AM conversion caused by the power amplifier

Distortion of the signal constellation caused by the power amplifier

Note the amplifier model is based on a text data file. It can be replaced with an MWO circuit or a VSS behavioral amplifier model that accounts for frequency dependency. This test bench is used to illustrate several capabilities of VSS.

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