LTE_UL_TX_TestBench

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Design Notes

LTE Uplink User Equipment TX Test Bench

This example demonstrates:

LTE FDD Uplink TX, compliant with 3GPP specifications.

Specification document: TS 36.104, TS 36.211, TS 36.212

Configurable options include:

- CarrierFreq_MHz : carrier frequency of the signal in MHz

- TxOutLvlStart_dBm, TxOutLvlSpan_dBm, TxOutLvlStep_dBm: define swept power of transmitted signal

- FrameType: frame type and cycling preffix:

- 0: Frame structure type 1 / Normal CP: FDD

- 1: Frame structure type 2 / Normal CP: TDD

- 2: Frame structure type 1 / Extended CP: FDD

- 3: Frame structure type 2 / Extended CP: TDD

- N_RB_UL: number or resource blocks used for transmission; determines the channel bandwith as defined in the specifications (See Global Definitions for relationship between N_RB_UL and channel BW).

- ModType: modulation type (QPSK, 16QAM, 64QAM)

- RB_PATTERN_INDX: indexes of the resource blocks assigned to the uplink transmission

The test bench can be used to monitor:

- The CCDF at the input and output of DUT

- The TX signal spectrum at the input and output of DUT

- EVM %rms vs. output power

- The impact of phase noise on EVM

- The impact of phase/amplitude and DC offset on EVM

- ACPR

N_RB_UL defines the channel bandwith as defined in the specifications.

Note that the amplifier model is a behavioral model that can be replaced with the desired device, including an MWO circuit.

This example can be used to test a PA's error vector magnitude (EVM) performance vs. output power.

A reference IQ plot versus the measured IQ plot is shown. EVM measurements are calculated for each power level and plotted in the "EVM vs. Output Power" graph.

Please read the online help for information on any of the blocks that are used in the system diagrams. In addition, please read the online help for ACPR and EVM measurements.